Speakers and Talks

Ygor Aguiar, CERN, European Organization for Nuclear Research, Switzerland

• SETs in digital circuits and hardening techniques at design level

Giovanni Bartolini, Beamide Srl, Italy

• MRADSIM – Matter Radiation Interactions Simulator

Stefano Bonaldo, University of Padova, Italy

• Evolution of TID Effects with the Scaling Down of Microelectronic CMOS Technologies

Ludovica Bozzoli, Argotec Srl

• HAWK Platform: Challenges of Operating Micro-Satellites in Deep-Space

Stephen Buchner, Consultant to U.S. Naval Research Laboratory, DC, USA

• Fundamental Mechanisms of Single Event Effects
• Radiation Hardness Assurance for Single Event Effects
• Fundamentals of the pulsed laser technique for single-event effects testing

Ennio Capria, ESRF, European Synchrotron Radiation Facility, France

• How synchrotron light sources can help to overcome the major limitations related to Heavy Ions Single Event Effects testing in electronic circuits
• RADNEXT: A distribute research infrastructure for the radiation hardness testing of cutting-edge microelectronic devices

Matteo Cecchetto, CERN, European Organization for Nuclear Research, Switzerland

• Electronic failures in the accelerator radiation environment and test facilities

Juan Antonio Clemente, UCM, Universidad Complutense de Madrid, Spain

• Analyzing data extracted from radiation tests in advanced SRAMs

Corrado De Sio, Polytechnic University of Turin, Italy

• Reliability Analysis and Fault Tolerance of Reconfigurable Systems-on-Chip

Clémentine Durnez, CNES, Centre national d’Études Spatiales, France

• Radiation Effects on CMOS image sensors

Viyas Gupta, ESA/ESTEC, European Space Agency, The Netherlands

• ESA Radiation Hardening Assurance from High to Low Class Mission

Corinna Martinella, ETH Zurich – Advanced Power Semiconductor (APS) Laboratory, Switzerland

• Radiation effects in wide-bandgap power devices

Dale McMorrow, U.S. Naval Research Laboratory, DC, USA

• Fundamentals of the pulsed laser technique for single-event effects testing
• Fundamental Mechanisms of Single Event Effects
• Radiation Hardness Assurance for Single Event Effects

Hans-Juergen Sedlmayr, DLR, Institute of Robotics and Mechatronics, Germany

• COTS in (Deep) Space

Luca Sterpone, Polytechnic University of Turin, Italy

• SEE effects on VLSI devices: challenges and solutions

Eleonora Vacca, Polytechnic University of Turin, Italy

• Reliability Analysis and Fault Tolerance of Reconfigurable Systems-on-Chip

Fabian Luis Vargas, IHP, Leibniz Institute for High Performance Microelectronics, Germany

• On-chip infrastructure to leverage system reliability for space applications

Raoul Velazco, Laboratoire TIMA, University Grenoble Alpes, France

• Error-rate prediction for programmable circuits: methodology, tools and studied cases