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Program Overview
Monday December 4
| 08:30-08:45 | Welcome Desk |
| 08:45-09:00 | SERESSA Opening |
| 09:00-10:10 | Fundamental Mechanisms of Single Event Effects Speaker: Stephen Buchner, Consultant to U.S. Naval Research Laboratory |
| 10:10-10:30 | Coffee Break |
| 10:30-11:30 | Radiation Effects on CMOS image sensors Speaker: Clementine Durnez, CNES |
| 11:30-12:30 | SEE effects on VLSI devices: challenges and solutions Speaker: Luca Sterpone, Politecnico di Torino |
| 12:30-14:00 | Lunch Break |
| 14:00-15:00 | Evolution of TID Effects with the Scaling Down of Microelectronic CMOS Technologies Speaker: Stefano Bonaldo, Universita di Padova |
| 15:00-16:10 | SETs in digital circuits and hardening techniques at design level Speaker: Ygor Aguiar, CERN |
| 16:10-16:30 | Coffee Break |
| 16:30-17:30 | Electronic failures in the accelerator radiation environment and test facilities Speaker: Matteo Cecchetto, CERN |
| 17:30-20:00 | Free |
Tuesday December 5
| 09:00-10:10 | Radiation effects in wide-bandgap power devices Speaker: Corinna Martinella, ETH Zurich |
| 10:10-10:30 | Coffee Break |
| 10:30-11:30 | Fundamentals of the pulsed laser technique for single-event effects testing Speaker: Dale McMorrow, U.S. Naval Research Laboratory |
| 11:30-12:30 | HAWK Platform: Challenges of Operating Micro-Satellites in Deep-Space Speaker: Ludovica Bozzoli, Argotec |
| 12:30-14:00 | Lunch Break |
| 14:00-15:00 | Free |
| 15:00-16:10 | Bus for Argotec Laboratory |
| 16:10-17:30 | Visit to Argotec Laboratory |
| 17:30-19:30 | Free |
| 19:30-22:30 | Social Dinner @ “I quattro soldi” restaurant |
Wednesday December 6
| 09:00-10:10 | Radiation Hardness Assurance for Single Event Effects Speaker: Stephen Buchner, Consultant to U.S. Naval Research Laboratory |
| 10:10-10:30 | Coffee Break |
| 10:30-11:30 | Analyzing data extracted from radiation tests in advanced SRAMs Speaker: Juan Antonio Clemente, UCM |
| 11:30-12:30 | How synchrotron light sources can help to overcome the major limitations related to Heavy Ions Single Event Effects testing in electronic circuits Speaker: Ennio Capria, ESRF |
| 12:30-14:00 | Lunch Break |
| 14:00-15:00 | RADNEXT: A distributed research infrastructure for the radiation hardness testing of cutting-edge microelectronic devices Speaker: Ennio Capria, ESRF |
| 15:00-16:10 | ESA Radiation Hardness Assurance from High to Low Class Mission Speaker: Viyas Gupta, ESA |
| 16:10-16:30 | Coffee Break |
| 16:30-17:30 | COTS in (Deep) Space Speaker: Hans-Juergen Sedlmayr, DLR |
| 17:30-20:00 | Free |
Thursday December 7
| 09:00-10:10 | POSTER SESSION |
| 10:10-10:30 | Coffee Break |
| 10:30-11:30 | Reliability Analysis and Fault Tolerance of Reconfigurable Systems-on-Chip Speaker: Corrado De Sio, Eleonora Vacca, Politecnico di Torino |
| 11:30-12:30 | MRADSIM – Matter Radiation Interactions Simulator Speaker: Giovanni Bartolini, Beamide Srl |
| 12:30-14:00 | Lunch Break |
| 14:00-15:00 | On-chip infrastructure to leverage system reliability for space applications Speaker: Fabian Luis Vargas, IHP |
| 15:00-16:10 | Error-rate prediction for programmable circuits: methodology, tools and studied cases Speaker: Raoul Velazco, TIMA |
| 16:10-17:30 | Closing Session + Final Exam |
| 17:30-20:00 | Free |
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